光子学报, 2017, 46 (4): 0412001, 网络出版: 2017-05-03
小尺度表面粗糙度与介质吸收对介质折射率测量的影响
Effects of Small-scale Surface Roughness and Absorption on Refractive Index Measurement by the Brewster-angle and Critical-angle Techniques
基本信息
| DOI: | 10.3788/gzxb20174604.0412001 |
| 中图分类号: | O439;TN29 |
| 栏目: | |
| 项目基金: | The Research Project of National University of Defense Technology (No. ZK16-03-21) and the National Natural Science Foundation of China (Nos. 61205157, 61405250) |
| 收稿日期: | 2016-10-20 |
| 修改稿日期: | 2016-12-31 |
| 网络出版日期: | 2017-05-03 |
| 通讯作者: | |
| 备注: | -- |
张晓宝, 罗晖, 谭中奇, 刘文斌, 吴素勇. 小尺度表面粗糙度与介质吸收对介质折射率测量的影响[J]. 光子学报, 2017, 46(4): 0412001. ZHANG Xiao-bao, LUO Hui, TAN Zhong-qi, LIU Wen-bin, WU Su-yong. Effects of Small-scale Surface Roughness and Absorption on Refractive Index Measurement by the Brewster-angle and Critical-angle Techniques[J]. ACTA PHOTONICA SINICA, 2017, 46(4): 0412001.
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