太赫兹科学与电子信息学报, 2019, 17 (6): 1045, 网络出版: 2020-02-24  

设备级线缆强电磁辐照敏感度仿真分析

Simulation analysis of cable harsh electromagnetic irradiation susceptibility about electronics
作者单位
1 广州广电计量检测股份有限公司电磁兼容研究所, 广东广州 510656
2 装备发展部军事代表局驻镇江地区军事代表室, 江苏镇江 212000
引用该论文

刘恩博, 李智深, 陈旗, 张钰. 设备级线缆强电磁辐照敏感度仿真分析[J]. 太赫兹科学与电子信息学报, 2019, 17(6): 1045.

LIU Enbo, LI Zhishen, CHEN Qi, ZHANG Yu. Simulation analysis of cable harsh electromagnetic irradiation susceptibility about electronics[J]. Journal of terahertz science and electronic information technology, 2019, 17(6): 1045.

参考文献

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刘恩博, 李智深, 陈旗, 张钰. 设备级线缆强电磁辐照敏感度仿真分析[J]. 太赫兹科学与电子信息学报, 2019, 17(6): 1045. LIU Enbo, LI Zhishen, CHEN Qi, ZHANG Yu. Simulation analysis of cable harsh electromagnetic irradiation susceptibility about electronics[J]. Journal of terahertz science and electronic information technology, 2019, 17(6): 1045.

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