Chinese Optics Letters, 2020, 18 (6): 063602, Published Online: May. 13, 2020  

Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region Download: 818次

Author Affiliations
1 Institute of Modern Optics, Tianjin Key Laboratory of Micro-scale Optical Information Science and Technology, Nankai University, Tianjin 300350, China
2 School of Electrical Engineering and Automation, Tianjin University, Tianjin 300072, China
Basic Information
DOI: 10.3788/COL202018.063602
中图分类号: --
栏目: Nanophotonics
项目基金: This work was supported by the Key Program of the Natural Science Foundation of Tianjin (No. 19JCZDJC32700) and the Science and Technology Support Program of Tianjin (No. 17YFZCSY00740). This work was partially carried out at Engineering Research Center of Thin Film Photo-electronics Technology, Ministry of Education.
收稿日期: Jan. 10, 2020
修改稿日期: --
网络出版日期: May. 13, 2020
通讯作者: Xianghui Wang (wangxianghui@nankai.edu.cn)
备注: --

Jianxin Wang, Xianghui Wang, Ming Zeng. Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region[J]. Chinese Optics Letters, 2020, 18(6): 063602.

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