Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region

Jianxin Wang; Xianghui Wang; Ming Zeng

doi:doi:10.3788/COL202018.063602

Chinese Optics Letters, 2020, 18 (6): 063602, Published Online: May. 13, 2020

Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region Download： 819次

Jianxin Wang ¹Xianghui Wang ^1,*Ming Zeng ²

Author Affiliations

¹ Institute of Modern Optics, Tianjin Key Laboratory of Micro-scale Optical Information Science and Technology, Nankai University, Tianjin 300350, China

² School of Electrical Engineering and Automation, Tianjin University, Tianjin 300072, China

Figures & Tables

Fig. 1. (a) Schematic diagram of light scattering from a silicon hollow nanodisk illuminated by a focused RP beam. (b) Geometry of the hollow nanodisk.

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Fig. 2. Scattering spectrum of the hollow nanodisk at the position of (a) $x = 0 nm$ and (b) $x = 220 nm$ as a function of the incident wavelength, respectively. The green dashed lines denote the result of the overlapping of TED and MD.

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Fig. 3. (a) Relative amplitude and (b) phase difference between $D_{z}$ and $m_{y}$ for the different lateral displacements.

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Fig. 4. (a) 3D radiation pattern and (b) polar plot of the scattering field for the wavelength of 1030 nm when $x = 0 nm$ . (c) 3D radiation pattern for the wavelength of 1030 nm when $x = 220 nm$ . (d) Polar plots of the scattering field for different wavelengths when $x = 220 nm$ , 250 nm, 280 nm, 315 nm, 340 nm, and 355 nm, respectively. The solid dots and lines in (b) and (d) give the results obtained by FDTD simulation and the theoretical model, including the overlapping of TED and MD, respectively.

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Fig. 5. Far-field scattering for different lateral displacements at the wavelength of (a) 1030 nm and (b) 875 nm in the $x z$ plane, respectively. (c) The variations of lateral directivity as a function of lateral displacement for different wavelengths.

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Jianxin Wang, Xianghui Wang, Ming Zeng. Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region[J]. Chinese Optics Letters, 2020, 18(6): 063602.

Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region Download： 819次

Fig. 1. (a) Schematic diagram of light scattering from a silicon hollow nanodisk illuminated by a focused RP beam. (b) Geometry of the hollow nanodisk.

Fig. 2. Scattering spectrum of the hollow nanodisk at the position of (a) $x = 0 nm$ and (b) $x = 220 nm$ as a function of the incident wavelength, respectively. The green dashed lines denote the result of the overlapping of TED and MD.

Fig. 3. (a) Relative amplitude and (b) phase difference between $D_{z}$ and $m_{y}$ for the different lateral displacements.

Fig. 5. Far-field scattering for different lateral displacements at the wavelength of (a) 1030 nm and (b) 875 nm in the $x z$ plane, respectively. (c) The variations of lateral directivity as a function of lateral displacement for different wavelengths.

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Broadband transverse displacement sensing of silicon hollow nanodisk under focused radial polarization illumination in the near-infrared region Download： 819次

Fig. 1. (a) Schematic diagram of light scattering from a silicon hollow nanodisk illuminated by a focused RP beam. (b) Geometry of the hollow nanodisk.

Fig. 2. Scattering spectrum of the hollow nanodisk at the position of (a) x=0 nm and (b) x=220 nm as a function of the incident wavelength, respectively. The green dashed lines denote the result of the overlapping of TED and MD.

Fig. 3. (a) Relative amplitude and (b) phase difference between Dz and my for the different lateral displacements.

Fig. 5. Far-field scattering for different lateral displacements at the wavelength of (a) 1030 nm and (b) 875 nm in the xz plane, respectively. (c) The variations of lateral directivity as a function of lateral displacement for different wavelengths.

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Fig. 2. Scattering spectrum of the hollow nanodisk at the position of (a) $x = 0 nm$ and (b) $x = 220 nm$ as a function of the incident wavelength, respectively. The green dashed lines denote the result of the overlapping of TED and MD.

Fig. 3. (a) Relative amplitude and (b) phase difference between $D_{z}$ and $m_{y}$ for the different lateral displacements.

Fig. 5. Far-field scattering for different lateral displacements at the wavelength of (a) 1030 nm and (b) 875 nm in the $x z$ plane, respectively. (c) The variations of lateral directivity as a function of lateral displacement for different wavelengths.