激光与光电子学进展, 2017, 54 (4): 040001, 网络出版: 2017-04-19   

基于叠层衍射成像术的量化相位显微成像 下载: 4425次

Quantitative Phase Microscopy Imaging Based on Ptychography
潘安 1,2,*张艳 1,2赵天宇 1,2汪召军 1,2但旦 1,2史祎诗 2,3姚保利 1
作者单位
1 中国科学院西安光学精密机械研究所瞬态光学与光子技术国家重点实验室, 陕西 西安 710119
2 中国科学院大学, 北京 100049
3 中国科学院光电研究院, 北京 100094
引用该论文

潘安, 张艳, 赵天宇, 汪召军, 但旦, 史祎诗, 姚保利. 基于叠层衍射成像术的量化相位显微成像[J]. 激光与光电子学进展, 2017, 54(4): 040001.

Pan An, Zhang Yan, Zhao Tianyu, Wang Zhaojun, Dan Dan, Shi Yishi, Yao Baoli. Quantitative Phase Microscopy Imaging Based on Ptychography[J]. Laser & Optoelectronics Progress, 2017, 54(4): 040001.

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潘安, 张艳, 赵天宇, 汪召军, 但旦, 史祎诗, 姚保利. 基于叠层衍射成像术的量化相位显微成像[J]. 激光与光电子学进展, 2017, 54(4): 040001. Pan An, Zhang Yan, Zhao Tianyu, Wang Zhaojun, Dan Dan, Shi Yishi, Yao Baoli. Quantitative Phase Microscopy Imaging Based on Ptychography[J]. Laser & Optoelectronics Progress, 2017, 54(4): 040001.

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