Chinese Optics Letters, 2017, 15 (4): 043401, Published Online: Jul. 25, 2018   

13.5  nm Schwarzschild microscope with high magnification and high resolution

Author Affiliations
Key Laboratory of Advanced Micro-Structured Materials MOE, Institute of Precision Optical Engineering, School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
Figures & Tables

Fig. 1. Optical structure of the Schwarzschild microscope.

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Fig. 2. Image MTF curve of the Schwarzschild objective.

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Fig. 3. Object resolutions along with the change of object distance at different FOVs: (a) 1 to 1200 nm resolution; (b) zoomed-in view of the 0 to 450 nm resolutions in (a).

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Fig. 4. Object resolutions along with the change of image distance at different FOVs.

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Fig. 5. MTF of different errors.

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Fig. 6. Schematic of the source and the Schwarzschild imaging system.

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Fig. 7. Best imaging figure and the intensity profile.

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Fig. 8. Comparison of the results between the simulation and experiment.

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Fig. 9. Best object points are imaged ten times.

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Table1. Parameters of the Schwarzschild Objective

L1 (mm)L2 (mm)L3(mm)H1 (mm)H2 (mm)R1 (mm)R2 (mm)
119.65960.5043221.00047.5929.82493.45232.480

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Shenghao Chen, Xin Wang, Qiushi Huang, Shuang Ma, Zhanshan Wang. 13.5  nm Schwarzschild microscope with high magnification and high resolution[J]. Chinese Optics Letters, 2017, 15(4): 043401.

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