光学 精密工程, 2009, 17 (5): 1063, 网络出版: 2009-10-28  

ISO5436-2的表面形貌评定基准

Assessment mean lines of surface texture based on ISO5436-2
作者单位
1 华中科技大学 机械学院 仪器系,湖北 武汉 430074
2 华侨大学,福建 泉州 362021
3 哈德斯菲尔德大学 精密技术中心,英国
引用该论文

崔长彩, 蒋向前, 李小改, 刘晓军. ISO5436-2的表面形貌评定基准[J]. 光学 精密工程, 2009, 17(5): 1063.

CUI Chang-cai, JIANG Xiang-qian, LI Xiao-gai, LIU Xiao-jun. Assessment mean lines of surface texture based on ISO5436-2[J]. Optics and Precision Engineering, 2009, 17(5): 1063.

参考文献

[1] 戴蓉,谢铁邦. 新型一维位移工作台的设计及特性分析[J].光学精密工程,2006,14(4):428-433.

    DAI R,XIE T B. Design and analysis od 1-DOF nano-positioning stage[J]. Opt. Precision Eng.,2006,14(4): 428-433. (in Chinese)

[2] JIANG X Q,BLUNT L,STOUT K J. Application of the lifting wavelet to rough surfaces[J]. Precision Engineering,2001,25 (2): 83-89.

[3] YUAN Y B,QIANG X F,SONG J F,et al.. Fast algorithm for determining the Gaussian filtered mean line in surface metrology[J]. Precision Engineering,2000,241(1): 62-69.

[4] 蒋向前. 新一代GPS标准理论与应用[M]. 北京:高等教育出版社,2007.

    JIANG X Q. Theory and Application of New-Generation Geometrical Product Specification[M]. Beijing:High Education Press,2007. (in Chinese)

[5] British Standards Institution. ISO 5436-2 Geometrical product specifications surface texture: profile method;measurement standards-part 2: software measurement standards[S]. London:BSI,2003.

[6] Softgauges for Surface topography[EB/OL]. http://161.112.232.32/softgauges

[7] British Standards Institution.ISO 11562 Geometric product specifications-surface texture: profile method - metrological characteristics of phase correct filters[S].London:BSI,1998.

[8] 黄富贵,崔长彩. 评定直线度误差的最小二乘法与最小包容区域法精度之比较[J]. 光学 精密工程,2007,15(6):889-893.

    HUANG F G,CUI CH C. Comparison of evaluating precision of straightness error between least square method and least envelope zone method[J]. Opt. Precision Eng.,2007,15(6):889-893. (in Chinese)

[9] CUI CH C,YE D,HUANG Q C,et al.. Precise computation of planar straightness error using genetic algorithm[J]. Opt. Precision Eng.,2003,11(4): 374-378

崔长彩, 蒋向前, 李小改, 刘晓军. ISO5436-2的表面形貌评定基准[J]. 光学 精密工程, 2009, 17(5): 1063. CUI Chang-cai, JIANG Xiang-qian, LI Xiao-gai, LIU Xiao-jun. Assessment mean lines of surface texture based on ISO5436-2[J]. Optics and Precision Engineering, 2009, 17(5): 1063.

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!