[1] Ramdani M, Sicard E, Boyer A, et al. The electromagnetic compatibility of integrated circuits-Past, present, and future［J］. IEEE Trans Electromagnetic Compatibility, 2009, 51(1): 78-100.

[2] 粟涛,杨叶花,王自鑫,等.微控制器射频抗扰性与受测引脚类型的关系［J］.电波科学学报, 2013, 28(4): 133-141.(Su Tao, Yang Yehua, Wang Zixin, et al. Relationship between radio frequency immunity and type of the pin under test of microcontrollers. Chinese Journal of Radio Science, 2013, 28(4): 133-141)

[3] 刘统,周长林,周东方,等.32位数字信号控制器电磁敏感度分析［J］.强激光与粒子束， 2015， 27: 103210.(Liu Tong, Zhou Changlin, Zhou Dongfang, et al. Electromagnetic susceptibility analysis of 32 bit digital signal controller. High Power Laser and Particle Beams, 2015, 27: 103210)

[4] Gros J B, Duchamp G, Meresse A, et al. Electromagnetic immunity model of an ADC for microcontroller’s reliability improvement［J］. Microelectronics Reliability, 2009, 49(9): 963-966.

[5] Ayed A, Dubois T, Levant J L, et al. A new method for the characterization of electronic components immunity［J］. IEEE Trans Instrumentation & Measurement, 2015, 64(9): 2496-2503.

[6] Ayed A, Dubois T, Levant J L, et al. Failure mechanism study and immunity modeling of an embedded analog-to-digital converter based on immunity measurements［J］. Microelectronics Reliability, 2015, 55(9): 2067-2071.

[7] IEC 62132-4 integrated circuits-measurement of electromagnetic immunity 150 kHz to 1 GHz-Part 4: Direct RF power injection method［S］. International Electrotechnical Commission. 2006.

[8] Dhia S B, Boyer A. Long-term electro-magnetic robustness of integrated circuits: EMRIC research project［J］. Microelectronics Reliability, 2013, 53(9/11): 1266-1272.

[9] 朱瑜,林楷辉,叶凡,等.一种应用于高速高精度流水线ADC的差分参考电压源［J］.复旦学报(自然科学版), 2011(4): 402-409.(Zhu Yu, Lin Kaihui, Ye Fan, et al. A differencial reference used in high speed high resolution pipelined ADC. Journal of Fudan University(Natural Science), 2011(4): 402-409)

[10] Orietti E, Montemezzo N, Buso S, et al. Reducing the EMI susceptibility of a Kuijk bandgap［J］. IEEE Trans Electromagnetic Compatibility, 2008, 50(4): 876-886.

[11] Zhang Bowen, Zhang Xiaoling, Xiong Wenwen, et al. The investigation of the zero temperature coefficient point of power MOSFET［J］. Journal of Semiconductors, 2016, 37(6): 105-109.

[12] 拉尔 P，派特 M G，哈基姆 E B.温度对微电子和系统可靠性的影响［M］.北京: 国防工业出版社， 2008: 120-128.(Lall P, Pecht M G, Hakim E B. Influence of temperature on microelectronics and system reliability. Beijing: National Defense Industry Press, 2008: 120-128)

[13] 尹勇生,杨鑫波,邓红辉.应用于高速高精度流水线ADC中的差分参考源［J］.电子测量与仪器学报, 2012, 26(12): 1043-1049.(Yin Yongsheng, Yang Xinbo, Deng Honghui. A differential reference voltage source used in high-speed high-precision pipelined ADC. Journal of Electronic Measurement and Instrument, 2012, 26(12): 1043-1049)