用于三维测量的快速相位解包裹算法

减少条纹投影轮廓术的条纹图数量一直是本领域的研究热点。传统的时间相位解包裹算法, 一般需要额外的条纹信息来确定条纹级次, 导致条纹图数量过多。提出一种用于三维测量的快速相位解包裹算法, 只需要N步标准相移正弦条纹图, 就可以完成绝对相位的计算。首先, 利用标准相移算法计算包裹相位和消除背景的掩膜; 然后, 直接利用包裹相位和掩膜, 根据连通域标记算法计算条纹级次, 进而求得绝对相位。该方法最少只需3幅条纹图, 就可以完成三维测量, 数据处理速度快。计算机仿真和实验结果验证了该方法的有效性和鲁棒性。

Abstract

Reducing the number of fringe patterns for fringe projection profilometry (FPP) has been a hot topic in the field. The traditional temporal phase unwrapping algorithm generally requires additional fringe information to determine the fringe order, which leads to the excessive number of fringe patterns.A fast phase unwrapping algorithm for three-dimensional (3D) measurement is proposed. Only N-step standard phase-shifting sinusoidal fringe patterns are needed to calculate the absolute phase. Firstly, the standard phase-shifting algorithm is used to calculate the wrapped phase and the mask to eliminate the background. Then, the wrapped phase and mask are used to solve the fringe level according to the connected component labeling theorem, and then the absolute phase is obtained. The proposed method needs a minimum of three fringe patterns to complete the 3D measurement, and the data processing speed is fast. Computer simulation and experimental results verify the effectiveness and robustness of the proposed method.

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王霖, 韩旭, 伏燕军, 黄春志, 史耀群. 用于三维测量的快速相位解包裹算法[J]. 应用光学, 2019, 40(2): 271. WANG Lin, HAN Xu, FU Yanjun, HUANG Chunzhi, SHI Yaoqun. Fast phase unwrapping algorithm for 3D measurement[J]. Journal of Applied Optics, 2019, 40(2): 271.

用于三维测量的快速相位解包裹算法

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