红外技术, 2017, 39 (5): 463, 网络出版: 2017-06-06  

蓝宝石/SiO2/AlN/GaN多层结构表面热应力仿真分析

Thermal Stress Analysis of Surface of Sapphire/SiO2/AlN/GaN Epilayers
作者单位
1 西安工业大学光电工程学院, 陕西 西安 710021
2 微光夜视技术重点实验室, 陕西 西安 710065
引用该论文

陈靖, 程宏昌, 吴玲玲, 冯刘, 苗壮. 蓝宝石/SiO2/AlN/GaN多层结构表面热应力仿真分析[J]. 红外技术, 2017, 39(5): 463.

CHEN Jing, CEHNG Hongchang, WU Lingling, FENG Liu, MIAO Zhuang. Thermal Stress Analysis of Surface of Sapphire/SiO2/AlN/GaN Epilayers[J]. Infrared Technology, 2017, 39(5): 463.

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陈靖, 程宏昌, 吴玲玲, 冯刘, 苗壮. 蓝宝石/SiO2/AlN/GaN多层结构表面热应力仿真分析[J]. 红外技术, 2017, 39(5): 463. CHEN Jing, CEHNG Hongchang, WU Lingling, FENG Liu, MIAO Zhuang. Thermal Stress Analysis of Surface of Sapphire/SiO2/AlN/GaN Epilayers[J]. Infrared Technology, 2017, 39(5): 463.

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