光子学报, 2019, 48 (12): 1248006, 网络出版: 2020-03-17 复制并引用该论文  本文已被引 1 次  被引通知

图 & 表

图 1. Si-SPAD探测效率测量装置示意图Schematic setup for the detection efficiency measurement of Si-SPAD

Fig. 1. Si-SPAD探测效率测量装置示意图Schematic setup for the detection efficiency measurement of Si-SPAD

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图 2. Si-SPAD后脉冲概率测量装置原理图Schematic diagram for the afterpulse probability of Si-SPAD

Fig. 2. Si-SPAD后脉冲概率测量装置原理图Schematic diagram for the afterpulse probability of Si-SPAD

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图 3. Si-SPAD死时间分布Dead time distribution of Si-SPAD

Fig. 3. Si-SPAD死时间分布Dead time distribution of Si-SPAD

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表 1基于标准探测器的Si-SPAD探测效率测量

Table1. Detection efficiency measurement of Si-APD using standard detector

Year Uncertainty(k=1) Wavelength/nm Measurement of additional parameters Reference 2000 ~1% 632.8 Dead time [1] 2005 6.8% 632.8 Dead time [3] 2007 0.17% 702 Dead time and afterpulsing [5] 2015 0.31% 770 Dead time [8] 2016 0.16% 770 / [9] This work 0.3% 632.8 Dead time and afterpulsing /

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表 2测量不确定度来源及分析

Table2. Measurement uncertainty budget

Source of uncertainty Relative uncertainty of value/% Sensitivity coefficient Contribution/% Type AType B 0.10 1 0.10 Total counting 0.15 1.007 0.151 Noise counting 4 0.008 0.032 Afterpulsing probability 10 0.005 0.05 Dead time 3 0.017 0.051 Voltage measurement 0.08 1 0.08 Amplifiers gain calibration 0.16 1 0.16 Power correction 0.09 1 0.09 Objective transmittance 0.05 1 0.05 Wavelength 0.06 1 0.06 Spectral responsivity@632.8 nm 0.05 1 0.05 Combined standard uncertainty 0.30 Expanded uncertainty (k=2) 0.6

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刘长明, 史学舜, 张鹏举, 庄新港, 刘红博. 基于标准探测器的硅单光子雪崩探测器探测效率测量[J]. 光子学报, 2019, 48(12): 1248006. Chang-ming LIU, Xue-shun SHI, Peng-ju ZHANG, Xin-gang ZHUANG, Hong-bo LIU. Detection Efficiency Measurement of Silicon Single-photon Avalanche Detector Traceable Using Standard Detector[J]. ACTA PHOTONICA SINICA, 2019, 48(12): 1248006.