基于光谱烧孔效应的激光稳频技术研究与进展 下载: 1699次
Research and Development on Laser Frequency Stabilization Based on Spectral Hole-Burning Effect
1 中国科学院理化技术研究所功能晶体与激光技术重点实验室激光物理与技术研究中心, 北京 100190
2 中国计量科学研究院时间频率计量研究所, 北京 100029
图 & 表
图 1. 光谱烧孔示意图
Fig. 1. Diagram of spectral hole-burning
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图 2. 入射激光与光谱烧孔相互作用示意图。(a)激光频率与光谱烧孔中心频率相同;(b)激光频率大于光谱烧孔中心频率;(c)激光频率小于光谱烧孔中心频率
Fig. 2. Diagram of interaction between incident laser and spectral hole-burning. (a) Laser frequency equal to central frequency of spectral hole-burning; (b) laser frequency higher than central frequency of spectral hole-burning; (c) laser frequency lower than central frequency of spectral hole-burning
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图 3. 光谱烧孔离子能级结构图
Fig. 3. Energy-level structure of ions for spectral hole-burning
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图 4. 光谱烧孔稳频实验装置图
Fig. 4. Experimental setup of laser frequency stabilization based on spectral hole-burning effect
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图 5. 有F-P腔预稳的光谱烧孔稳频实验装置图
Fig. 5. Experimental setup of laser frequency stabilization based on spectral hole-burning effect with pre-stabilization on F-P cavity
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表 1基于低温稀土离子掺杂晶体光谱烧孔效应的激光稳频技术的研究材料
Table1. Materials for laser frequency stabilization based on spectral hole-burning effect in cryogenic rare-earth-ion-doped crystals
Ion | Lockedwavelength /nm | Energy-level-transition | Hostmaterial |
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Eu3+ | 580 | 7F0→5D0 | Y2SiO5 | Tm3+ | 793 | 3H6→3H4 | YAG、CaF2 | Er3+ | 1550 | 4I15/2→4I13/2 | Y2SiO5 | Pr3+ | 606 | 3H4→1D2 | Y2SiO5 |
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表 2基于低温稀土离子掺杂晶体光谱烧孔效应的激光稳频技术研究进展
Table2. Research progress on laser frequency stabilization based on spectral hole-burning effect in cryogenic rare- earth-ion-doped crystals
Year | Team | Laser | Stabilizationwavelength /nm | Spectral Hole-burningmaterial | Result | Method |
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1999 | Montana StateUniversity, USA | External cavitydiode laser | 798 | Tm3+∶CaF2 | Allandeviation of 780±120 Hzfor 20-50 ms integration time | Ref. [19] | 2000 | Montana StateUniversity, USA | External cavitydiode lasers | 793 | Tm3+∶Y3Al5O12 | Stabilization to 20 Hz on10 ms time scale | Ref. [20] | 2001 | Montana StateUniversity, USA | Diode lasers | 1536 | Er3+∶Y2SiO5 | Allandeviation of 500 Hzfor 2 ms integration time drift of7 kHz/min over several minutes | Ref. [21],[22], [23] | 2002 | Montana StateUniversity, USA | Diode lasers | 1537 | Er3+∶KTP | 200 Hz at 1.5 μm and independentto 20 Hz at 793 nm over10 ms integration time | Ref. [24] | 2003 | Montana StateUniversity, USA | Diode lasers | 1523 | Er3+∶D2 ∶CaF2 | Frequency stability of 2 kHzto 680 Hz over 20 ms to 500 sintegration time | Ref. [25] | 2007 | Lund Institute ofTechnology, Sweden | Dye lasers | 606 | Pr3+∶Y2SiO5 | Frequency stability of1 kHz over 10 μs time scaletogether with long-term frequencydrift below 1 kHz/s | Ref. [17] | 2007 | Montana StateUniversity, USA | Single-frequencydiode lasers | 1530.4 | Er3+∶LiYF4 | Allan deviation of 1.5 kHzover 0.05-50 s integration times,with laser frequency drift reducedto less than 1.4 kHz/min | Ref. [26] | 2011 | National Instituteof Standards andTechnology, USA | Dye lasers | 580 | Eu3+∶Y2SiO5 | Allan deviation of≤6×10-16 for 2 s≤t≤8 sintegration time | Ref. [14] | 2013 | National Instituteof Standardsand Technology(NIST), USA | Dye lasers | 580 | Eu3+∶Y2SiO5 | Short-term frequencystability of 7×10-16τ-1/2that averages down to@204 s integration time | Ref. [28] | 2015 | National Instituteof Standards andTechnology(NIST), USA | Dye lasers | 580 | Eu3+∶Y2SiO5 | Fractional frequencyinstability of 1×10-15τ-1/2that averages to @73 sintegration time | Ref. [39] | 2017 | PSL ResearchUniversity,France | External cavity diodelasers + frequencydoubling in PPLN | 580 | Eu3+∶Y2SiO5 | Fractional frequencystability of 2×10-14 from1 to 100 s integration time | Ref. [40] |
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韩琳, 林弋戈, 杨晶, 蓝英杰, 李烨, 王小军, 薄勇, 彭钦军. 基于光谱烧孔效应的激光稳频技术研究与进展[J]. 激光与光电子学进展, 2019, 56(11): 110003. Lin Han, Yige Lin, Jing Yang, Yingjie Lan, Ye Li, Xiaojun Wang, Yong Bo, Qinjun Peng. Research and Development on Laser Frequency Stabilization Based on Spectral Hole-Burning Effect[J]. Laser & Optoelectronics Progress, 2019, 56(11): 110003.