光子学报, 2012, 41 (9): 1094, 网络出版: 2012-08-31   

基于椭圆形光强分布光栅投影的三维面形测量方法

Phase Measuring Profilometry Based on Elliptic Pattern Grating
作者单位
淮阴师范学院 物理与电子电气工程学院, 江苏 淮安 223300
引用该论文

边心田, 姬保卫, 程菊, 左芬. 基于椭圆形光强分布光栅投影的三维面形测量方法[J]. 光子学报, 2012, 41(9): 1094.

BIAN Xintian, JI Baowei, CHENG Ju, ZUO Fen. Phase Measuring Profilometry Based on Elliptic Pattern Grating[J]. ACTA PHOTONICA SINICA, 2012, 41(9): 1094.

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边心田, 姬保卫, 程菊, 左芬. 基于椭圆形光强分布光栅投影的三维面形测量方法[J]. 光子学报, 2012, 41(9): 1094. BIAN Xintian, JI Baowei, CHENG Ju, ZUO Fen. Phase Measuring Profilometry Based on Elliptic Pattern Grating[J]. ACTA PHOTONICA SINICA, 2012, 41(9): 1094.

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