基于椭圆形光强分布光栅投影的三维面形测量方法

边心田; 姬保卫; 程菊; 左芬

doi:doi:10.3788/gzxb20124109.1094

光子学报, 2012, 41 (9): 1094, 网络出版: 2012-08-31

基于椭圆形光强分布光栅投影的三维面形测量方法

Phase Measuring Profilometry Based on Elliptic Pattern Grating

论文大纲

边心田 ^*姬保卫程菊左芬

作者单位

淮阴师范学院物理与电子电气工程学院, 江苏淮安 223300

三维测量椭圆形光强分布光栅条纹分析相位展开 3D measurement Elliptic pattern grating Fringe analysis Phase unwrap

摘要

基于椭圆形光强分布光栅投影测量物体三维面形的方法, 将椭圆形光强分布光栅投影到被测物体表面, 用摄像机获取变形条纹图, 通过系统参量和条纹图携带的相位信息求解出物体的三维面形.推导出通过椭圆形光强分布光栅条纹求解相位的计算公式并对提出方法作了计算机仿真.实验结果表明该方法可以比较准确地测量物体的三维面形,在噪音较大的情况下测量结果仍具有较高准确度.

Abstract

A new method to measure the three dimensional (3D) shape is proposed. In the measurement, the elliptic fringe pattern was projected to the surface of the object and the 3D shape of the object can be reconstructed by this method based on phase measurement profilometry. Some calculation formulas for phase and height are derived. A result of our method is compared with that of the phase measurement profilometry (PMP), which shows that the measurement accuracy of this method can meet accuracy requirement of the measurement. Moreover, this method owns strong ability of antinoise. With large noise, this method also can reconstruct the 3D shape of object. Computer simulation and preliminary validate the feasibility of this method.

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边心田, 姬保卫, 程菊, 左芬. 基于椭圆形光强分布光栅投影的三维面形测量方法[J]. 光子学报, 2012, 41(9): 1094. BIAN Xintian, JI Baowei, CHENG Ju, ZUO Fen. Phase Measuring Profilometry Based on Elliptic Pattern Grating[J]. ACTA PHOTONICA SINICA, 2012, 41(9): 1094.

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