样品厚度对薄膜法X射线荧光光谱测量的影响研究
甘婷婷, 张玉钧, 赵南京, 殷高方, 肖雪, 章炜, 刘建国, 刘文清. 样品厚度对薄膜法X射线荧光光谱测量的影响研究[J]. 光谱学与光谱分析, 2016, 36(12): 4039.
GAN Ting-ting, ZHANG Yu-jun, ZHAO Nan-jing, YIN Gao-fang, XIAO Xue, ZHANG Wei, LIU Jian-guo, LIU Wen-qing. Study of the Impact of Sample Thickness on Thin Film Method X-Ray Fluorescence Spectrum Measurement[J]. Spectroscopy and Spectral Analysis, 2016, 36(12): 4039.
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甘婷婷, 张玉钧, 赵南京, 殷高方, 肖雪, 章炜, 刘建国, 刘文清. 样品厚度对薄膜法X射线荧光光谱测量的影响研究[J]. 光谱学与光谱分析, 2016, 36(12): 4039. GAN Ting-ting, ZHANG Yu-jun, ZHAO Nan-jing, YIN Gao-fang, XIAO Xue, ZHANG Wei, LIU Jian-guo, LIU Wen-qing. Study of the Impact of Sample Thickness on Thin Film Method X-Ray Fluorescence Spectrum Measurement[J]. Spectroscopy and Spectral Analysis, 2016, 36(12): 4039.
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