针对复杂电磁对抗环境中电子信息装备面临的强电磁环境威胁以及防护加固需求，对强电磁防护技术的发展现状进行了综述，并提出了强电磁系统级综合防护的发展展望。强电磁防护是为了保证电子信息装备在强电磁环境中免受损伤或损毁的技术手段，从电磁波的耦合途径分析了当前电磁防护的重点和难点，然后分别以限幅器技术、频率滤波技术、能量选择防护技术三个方面对前门防护技术的发展现状进行了分析总结，最后从新型屏蔽材料和防护器件两个方面对新型电磁防护技术进行了展望，并从前后门一体防护、场路一体防护、多域联合防护三个角度对系统级电磁防护进行了总结，为电子信息装备在复杂电磁环境下的电磁防护加固设计提供了支撑。

Fluorescence confocal laser-scanning microscopy (LSM) is one of the most popular tools for life science research. This popularity is expected to grow thanks to single-photon array detectors tailored for LSM. These detectors offer unique single-photon spatiotemporal information, opening new perspectives for gentle and quantitative superresolution imaging. However, a flawless recording of this information poses significant challenges for the microscope data acquisition (DAQ) system. We present a DAQ module based on the digital frequency domain principle, able to record essential spatial and temporal features of photons. We use this module to extend the capabilities of established imaging techniques based on single-photon avalanche diode (SPAD) array detectors, such as fluorescence lifetime image scanning microscopy. Furthermore, we use the module to introduce a robust multispecies approach encoding the fluorophore excitation spectra in the time domain. Finally, we combine time-resolved stimulated emission depletion microscopy with image scanning microscopy, boosting spatial resolution. Our results demonstrate how a conventional fluorescence laser scanning microscope can transform into a simple, information-rich, superresolved imaging system with the simple addition of a SPAD array detector with a tailored data acquisition system. We expected a blooming of advanced single-photon imaging techniques, which effectively harness all the sample information encoded in each photon.