强激光与粒子束, 2011, 23 (3): 770, 网络出版: 2011-04-01
合肥光源托歇克效应损失电子的探测
Detection of electron loss due to Touschek effect in Hefei Light Source
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孙玉聪, 蓝杰钦, 张剑锋, 徐宏亮, 孙葆根. 合肥光源托歇克效应损失电子的探测[J]. 强激光与粒子束, 2011, 23(3): 770. Sun Yucong, Lan Jieqin, Zhang Jianfeng, Xu Hongliang, Sun Baogen. Detection of electron loss due to Touschek effect in Hefei Light Source[J]. High Power Laser and Particle Beams, 2011, 23(3): 770.
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