光谱学与光谱分析, 2011, 31 (8): 2081, 网络出版: 2011-08-29
Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS
Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS
基本信息
DOI: | 10.3964/j.issn.1000-0593(2011)08-2081-05 |
中图分类号: | TH744.4 |
栏目: | |
项目基金: | National High Technology Research and Development Program of China (2009AA04Z131), Natural Science Foundation of China (50877056) |
收稿日期: | 2010-08-11 |
修改稿日期: | 2010-11-25 |
网络出版日期: | 2011-08-29 |
通讯作者: | |
备注: | -- |
HAO Hui-min, LI Shi-wei, ZHANG Wen-dong, LI Peng-wei, HAO Jun-yu, LU Hai-ning, Ken Jia, ZHANG Yong. Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS[J]. 光谱学与光谱分析, 2011, 31(8): 2081. HAO Hui-min, LI Shi-wei, ZHANG Wen-dong, LI Peng-wei, HAO Jun-yu, LU Hai-ning, Ken Jia, ZHANG Yong. Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS[J]. Spectroscopy and Spectral Analysis, 2011, 31(8): 2081.