光谱学与光谱分析, 2011, 31 (8): 2081, 网络出版: 2011-08-29
Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS
Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS
图 & 表
HAO Hui-min, LI Shi-wei, ZHANG Wen-dong, LI Peng-wei, HAO Jun-yu, LU Hai-ning, Ken Jia, ZHANG Yong. Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS[J]. 光谱学与光谱分析, 2011, 31(8): 2081. HAO Hui-min, LI Shi-wei, ZHANG Wen-dong, LI Peng-wei, HAO Jun-yu, LU Hai-ning, Ken Jia, ZHANG Yong. Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS[J]. Spectroscopy and Spectral Analysis, 2011, 31(8): 2081.