光谱学与光谱分析, 2011, 31 (8): 2081, 网络出版: 2011-08-29  

Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS

Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS
作者单位
1 Micro/Nano System Research Center, Taiyuan University of Technology, Taiyuan 030024, China
2 Automation Company of TISCO, Taiyuan 030003, China
3 Northwest Institute of Nuclear Technology, Xi’an 710024, China
4 Department of Research and Development, Brimrose Corporation of America, Baltimore 21152-9201, USA
5 State Key Laboratory of Electrical Insulation for Power Equipment, Xi’an Jiaotong University, Xi’an 710049, China
引用该论文

HAO Hui-min, LI Shi-wei, ZHANG Wen-dong, LI Peng-wei, HAO Jun-yu, LU Hai-ning, Ken Jia, ZHANG Yong. Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS[J]. 光谱学与光谱分析, 2011, 31(8): 2081.

HAO Hui-min, LI Shi-wei, ZHANG Wen-dong, LI Peng-wei, HAO Jun-yu, LU Hai-ning, Ken Jia, ZHANG Yong. Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS[J]. Spectroscopy and Spectral Analysis, 2011, 31(8): 2081.

参考文献

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HAO Hui-min, LI Shi-wei, ZHANG Wen-dong, LI Peng-wei, HAO Jun-yu, LU Hai-ning, Ken Jia, ZHANG Yong. Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS[J]. 光谱学与光谱分析, 2011, 31(8): 2081. HAO Hui-min, LI Shi-wei, ZHANG Wen-dong, LI Peng-wei, HAO Jun-yu, LU Hai-ning, Ken Jia, ZHANG Yong. Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS[J]. Spectroscopy and Spectral Analysis, 2011, 31(8): 2081.

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