Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS

HAO Hui-min; LI Shi-wei; ZHANG Wen-dong; LI Peng-wei; HAO Jun-yu; LU Hai-ning; Ken Jia; ZHANG Yong

doi:doi:10.3964/j.issn.1000-0593(2011)08-2081-05

光谱学与光谱分析, 2011, 31 (8): 2081, 网络出版: 2011-08-29

Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS

论文大纲

HAO Hui-min ^1,2LI Shi-wei ³ZHANG Wen-dong ¹LI Peng-wei ¹HAO Jun-yu ²LU Hai-ning ²Ken Jia ⁴ZHANG Yong ⁵

作者单位

¹ Micro/Nano System Research Center, Taiyuan University of Technology, Taiyuan 030024, China

² Automation Company of TISCO, Taiyuan 030003, China

³ Northwest Institute of Nuclear Technology, Xi’an 710024, China

⁴ Department of Research and Development, Brimrose Corporation of America, Baltimore 21152-9201, USA

⁵ State Key Laboratory of Electrical Insulation for Power Equipment, Xi’an Jiaotong University, Xi’an 710049, China

Insulation coating Thickness measurement DBPSO Boosting KPLS

摘要

Abstract

A novel thickness measurement method for surface insulation coating of silicon steel based on NIR spectrometry is explored. The NIR spectra of insulation coating of silicon steel were collected by acousto-optic tunable filter (AOTF) NIR spectrometer. To make full use of the effective information of NIR spectral data, discrete binary particle swarm optimization (DBPSO) algorithm was used to select the optimal wavelength variates. The new spectral data, composed of absorbance at selected wavelengths, were used to create the thickness quantitative analysis model by kernel partial least squares (KPLS) algorithm coupled with Boosting. The results of contrast experiments showed that the Boosting-KPLS model could efficiently improve the analysis accuracy and speed. It indicates that Boosting-KPLS is a more accurate and robust analysis method than KPLS for NIR spectral analysis. The maximal and minimal absolute error of 30 testing samples is respectively -0.02 μm and 0.19 μm, and the maximal relative error is 14.23%. These analysis results completely meet the practical measurement need.

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HAO Hui-min, LI Shi-wei, ZHANG Wen-dong, LI Peng-wei, HAO Jun-yu, LU Hai-ning, Ken Jia, ZHANG Yong. Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS[J]. 光谱学与光谱分析, 2011, 31(8): 2081. HAO Hui-min, LI Shi-wei, ZHANG Wen-dong, LI Peng-wei, HAO Jun-yu, LU Hai-ning, Ken Jia, ZHANG Yong. Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS[J]. Spectroscopy and Spectral Analysis, 2011, 31(8): 2081.

Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS

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