光电工程, 2011, 38 (12): 52, 网络出版: 2011-12-22  

KDP晶体应力数字式检测方法

Digital Measurement of the Stress of KDP Crystal
作者单位
成都精密光学工程研究中心, 成都 610041
摘要
使用高精度数字式应力仪测量 KDP晶体的应力, 给出整体应力分布。通过沿光轴方向测量, 消除晶体 o光和 e光的双折射效应的影响, 准确得到晶体材料自身的应力双折射分布。实验结果表明, 测量重复性优于 0.1 nm/cm。对 KDP晶体材料应力的高精度数字式检测对于加工和使用具有重要的指导意义。
Abstract
Using the high precision digital stress measurement instrument, we measured the stress of KDP crystal. Through measuring the optical axis of KDP, the birefringence of ordinary light and extraordinary light is diminished, and the inner stress of the KDP is gained, The repeatability of measurement is better than 0.1 nm/cm. The high precision digital stress measurement of KDP is of great importance to machining and utilization.
参考文献

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魏小红, 高波, 李强, 徐凯源, 刘昂, 柴立群. KDP晶体应力数字式检测方法[J]. 光电工程, 2011, 38(12): 52. WEI Xiao-hong, GAO Bo, LI Qiang, XU Kai-yuan, LIU Ang, CHAI Li-qun. Digital Measurement of the Stress of KDP Crystal[J]. Opto-Electronic Engineering, 2011, 38(12): 52.

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