[1] 高玲玲, 范勇, 陈念年, 等. 光学元件表面疵病快速检测分类方法研究[J]. 微计算机信息, 2008, 24(27): 306-307, 312.

    Gao L L, Fan Y, Chen N N, et al. A quick method of debris detecting and classifying for oversize optical element[J]. Microcomputer Information, 2008, 24(27): 306-307, 312.

[2] Papadopoulos G Z, Kotsiou V, Gallais A, et al. Wireless medium access control under mobility and bursty traffic assumptions in WSNs[J]. Mobile Networks and Applications, 2015, 20(5): 649-660.

[3] 中华人民共和国国家质量监督检验检疫总局, 中国国家标准化管理委员会. 光学零件表面疵病: GB/T 185-2006[S]. 北京: 中国标准出版社, 2006.

    General Administration of Quality Supervision, InspectionandQuarantine of the People's Republic of China, Standardization Administration of the People's Republic of China. Surface imperfections of optical elements: GB/T 1185-2006[S]. Beijing: Standards Press of China, 2006.

[4] 戴名奎, 徐德衍. 光学元件的疵病检验与研究现状[J]. 光学仪器, 1996, 18(3): 33-36.

    Dai M K, Xu D Y. The present situation of imperfections testing and researching on the optical components[J]. Optical Instruments, 1996, 18(3): 33-36.

[5] 张晓, 杨国光, 程上彝, 等. 光学表面疵病的激光频谱分析法及其自动检测仪[J]. 仪器仪表学报, 1994, 15(4): 396-399.

    Zhang X, Yang G G, Cheng S Y, et al. Laser frequency spectrum analysis method and automatic inspection instrument of optical surface inperfection[J]. Chinese Journal of Scientific Instrument, 1994, 15(4): 396-399.

[6] 戴名奎, 徐德衍. 光学元件的疵病检验与研究现状(续)[J]. 光学仪器, 1996, 18(4): 32-39.

    Dai M K, Xu D Y. The present situation of imperfections testing and researching on the optical components[J]. Optical Instruments, 1996, 18(4): 32-39.

[7] Baker L R. Microscope image comparator[J]. Optica Acta: International Journal of Optics, 1984, 31(6): 611-614.

[8] Baker L R. Inspection of surface flaws by comparator microscopy[J]. Applied Optics, 1988, 27(22): 4620-4625.

[9] Baker L R. On-machine measurement of roughness, waviness, and flaws[J]. Proceedings of SPIE, 1990, 1333: 248-256.

[10] 沈卫星. 相干滤波成像系统测量光学元件表面疵病[J]. 光学技术, 2000, 26(4): 361-362, 365.

    Shen W X. Surface defects of the optical elements measured by the coherent filter imaging system[J]. Optical Technique, 2000, 26(4): 361-362, 365.

[11] 杨甬英, 陆春华, 梁蛟, 等. 光学元件表面缺陷的显微散射暗场成像及数字化评价系统[J]. 光学学报, 2007, 27(6): 1031-1038.

    Yang Y Y, Lu C H, Liang J, et al. Microscopic dark-field scattering imaging and digitalization evaluation system of defects on optical devices precision surface[J]. Acta Optica Sinica, 2007, 27(6): 1031-1038.

[12] 王科, 刘缠牢. 球面光学元件表面疵病检测技术研究[J]. 光学仪器, 2013, 35(2): 7-10, 14.

    Wang K, Liu C L. Detection technology research of spherical optical element surface defect disease[J]. Optical Instruments, 2013, 35(2): 7-10, 14.

[13] Girnyk V I, Kostyukevych S O, Shepeliavyi P Ye, et al. Multilevel computer-generated holograms for reconstructing 3-D images in combined optical-digital security devices[J]. Semiconductor Physics, Quantum Electronics and Optoelectronics, 2002, 5(1): 106-114.

[14] 王华英, 王广俊, 赵洁, 等. 数字全息显微系统的成像分辨率分析[J]. 中国激光, 2007, 34(12): 1670-1675.

    Wang H Y, Wang G J, Zhao J, et al. Imaging resolution analysis of digital holographic microscopy[J]. Chinese Journal of Lasers, 2007, 34(12): 1670-1675.

[15] 马利红, 王辉, 金洪震, 等. 数字全息显微定量相位成像的实验研究[J]. 中国激光, 2012, 39(3): 0309002.

    Ma L H, Wang H, Jin H Z, et al. Experimental study on quantitative phase imaging by digital holographic microscopy[J]. Chinese Journal of Lasers, 2012, 39(3): 0309002.

[16] Cuche E, Marquet P, Depeursinge C. Simultaneous amplitude-contrast and quantitative phase-contrast microscopy by numerical reconstruction of Fresnel off-axis holograms[J]. Applied Optics, 1999, 38(34): 6994-7001.

[17] 冯忠耀, 贾昉, 周景会, 等. 数字全息中利用图像拼接测量大物体的三维形貌[J]. 中国激光, 2008, 35(12): 2017-2021.

    Feng Z Y, Jia F, Zhou J H, et al. Three-dimensional surface shape measurement of big objects by image splicing in digital holography[J]. Chinese Journal of Lasers, 2008, 35(12): 2017-2021.

[18] 于瀛洁, 陈刚, 戴翠霞, 等. 相位拼接技术在数字全息中的应用[J]. 光子学报, 2009, 38(11): 2975-2979.

    Yu Y J, Chen G, Dai C X, et al. Application of phase stitching technique on digital holography[J]. Acta Photonica Sinica, 2009, 38(11): 2975-2979.

[19] Widjaja J. Objective evaluation of images reconstructed from digital in-line Fresnel holograms by using coherent background elimination[J]. Optik, 2010, 121(9): 853-859.

[20] 王璠璟, 肖文, 潘锋, 等. 光学元件表面的数字全息检测[J]. 强激光与粒子束, 2012, 24(1): 79-83.

    Wang F J, Xiao W, Pan F, et al. Digital holographic detection of surface of optic component[J]. High Power Laser and Particle Beams, 2012, 24(1): 79-83.

[21] Verma S, Sarma S S, Dhar R, et al. Scratch enhancement and measurement in periodic and non-periodic optical elements using digital holography[J]. Optik, 2015, 126(21): 3283-3287.

[22] Ganjkhani Y, Charsooghi M A, Akhlaghi E A, et al. Super-resolved Mirau digital holography by structured illumination[J]. Optics Communications, 2017, 404: 110-117.

[23] Trivedi V, Joglekar M, Mahajan S, et al. Digital holographic imaging of refractive index distributions for defect detection[J]. Optics & Laser Technology, 2019, 111: 439-446.

[24] 陈晨, 王红军, 王大森, 等. 基于稀疏矩阵的光学元件表面疵病检测[J]. 中国激光, 2019, 46(4): 0404007.

    Chen C, Wang H J, Wang D S, et al. Surface defect detection of optical components based on sparse matrix[J]. Chinese Journal of Lasers, 2019, 46(4): 0404007.