光学学报, 2018, 38 (3): 0330001, 网络出版: 2018-03-20   

基于M壳层辐射的Si K边X射线吸收近边结构谱实验研究

Experimental Study on Si K-Edge X-Ray Absorption Near-Edge Structure with M-Shell Radiation
作者单位
中国工程物理研究院流体物理研究所, 四川 绵阳 621900
引用该论文

谭伯仲, 阳庆国, 刘冬兵, 母健, 胡厚胜, 李牧, 李俊. 基于M壳层辐射的Si K边X射线吸收近边结构谱实验研究[J]. 光学学报, 2018, 38(3): 0330001.

Tan Bozhong, Yang Qingguo, Liu Dongbing, Mu Jian, Hu Housheng, Li Mu, Li Jun. Experimental Study on Si K-Edge X-Ray Absorption Near-Edge Structure with M-Shell Radiation[J]. Acta Optica Sinica, 2018, 38(3): 0330001.

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谭伯仲, 阳庆国, 刘冬兵, 母健, 胡厚胜, 李牧, 李俊. 基于M壳层辐射的Si K边X射线吸收近边结构谱实验研究[J]. 光学学报, 2018, 38(3): 0330001. Tan Bozhong, Yang Qingguo, Liu Dongbing, Mu Jian, Hu Housheng, Li Mu, Li Jun. Experimental Study on Si K-Edge X-Ray Absorption Near-Edge Structure with M-Shell Radiation[J]. Acta Optica Sinica, 2018, 38(3): 0330001.

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