基于M壳层辐射的Si K边X射线吸收近边结构谱实验研究

基于纳秒高功率激光辐照高原子序数靶材产生的等离子体M壳层X射线辐射, 利用椭圆柱面晶体谱仪进行薄膜单晶Si样品的K边X射线吸收近边结构谱(XANES)静态实验研究；通过详细介绍实验方案, 分析椭圆柱面晶体谱仪的原理, 得到谱仪的位置-能量色散关系, 并对Au、Lu、Yb、Dy、Ta、Co 这6种靶材产生的等离子体X射线光谱进行比较。结果表明：通过比较这6种靶材产生的等离子体X射线光谱后发现, 在Si的K边(1839 eV)附近, Lu、Yb、Dy靶材的激光等离子体M壳层辐射相对其他几种靶材具有较高的光谱亮度, 对应的XANES的信噪比较好；实验获得的XANES与FEFF9.0软件计算结果基本符合, 验证了单发获得的静态实验数据是可靠的。

Abstract

With M-shell X-ray radiation from plasma produced by nanosecond high power laser irradiating on high atomic number targets, the experimental study on Si K-edge X-ray absorption near-edge structure (XANES) is carried out with an elliptic cylinder crystal spectrometer. By describing the experiment setup in detail, and analyzing the principle of elliptic cylinder crystal spectrometer, the position-energy dispersion relation of the spectrometer is obtained, and the laser plasma X-ray spectra from six targets of Au, Lu, Yb, Dy, Ta, and Co are compared. The results show that by comparing the laser plasma X-ray spectra from six targets of Au, Lu, Yb, Dy, Ta and Co, we find that the M-shell radiations from Lu, Yb, and Dy are more brilliant than the others in the vicinity of Si K-edge (1839 eV), and the corresponding signal to noise of XANES is much better. The XANES obtained from experiment and calculation by FEFF9.0 software are in good agreement with each other, indicating that the static experimental result of single shot is reliable.

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谭伯仲, 阳庆国, 刘冬兵, 母健, 胡厚胜, 李牧, 李俊. 基于M壳层辐射的Si K边X射线吸收近边结构谱实验研究[J]. 光学学报, 2018, 38(3): 0330001. Tan Bozhong, Yang Qingguo, Liu Dongbing, Mu Jian, Hu Housheng, Li Mu, Li Jun. Experimental Study on Si K-Edge X-Ray Absorption Near-Edge Structure with M-Shell Radiation[J]. Acta Optica Sinica, 2018, 38(3): 0330001.

基于M壳层辐射的Si K边X射线吸收近边结构谱实验研究

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