Photonics Research, 2017, 5 (3): 03000239, Published Online: Oct. 9, 2018  

Direct bandgap photoluminescence from n-type indirect GaInP alloys Download: 710次

Author Affiliations
1 School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798, Singapore
2 Low Energy Electronic Systems, Singapore-MIT Alliance for Research and Technology, Singapore 138602, Singapore
3 Department of Materials Science and Engineering, Massachusetts Institute of Technology, Massachusetts 02139, USA
Figures & Tables

Fig. 1. (a) [110]-pole TEM pattern of fully disordered lightly Te-doped Ga0.74In0.26P sample with n=7×1016  cm3. (b) SEM image of the etch pits of Ga0.74In0.26P film, and EPD=(3±0.5)×106  cm2.

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Fig. 2. Temperature-dependent normalized PL spectra (6–300 K) of Te-doped Ga0.74In0.26P samples with (a) n=7×1016  cm3, (b) n=9×1017  cm3, and (c) n=2×1018  cm3. The positions of NPx, LAx, and DAP emission peaks from Ref. [3] are labeled, and their positions are indicated by dashed black lines. Solid red lines and arrows indicate the positions of direct band emission, shifting with increasing temperature.

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Fig. 3. Peak positions of Te-doped Ga0.74In0.26P samples versus temperature. The data points marked with green stars are from Ref. [3]. Dashed lines are fitted to derive the thermal coefficients of the Γ band.

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Fig. 4. Temperature-dependent PL spectra (175–300 K) of Te-doped Ga0.74In0.26P samples with (a) S01, n=7×1016  cm3, (b) S02, n=9×1017  cm3, and (c) S03, n=2×1018  cm3.

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Fig. 5. Arrhenius plot of integrated PL intensity versus temperature for Te-doped Ga0.74In0.26P samples with n=9×1017  cm3 (red dots) and n=2×1018  cm3 (blue diamonds). The activation energies, Ea, were derived from the fitted dashed lines.

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Fig. 6. Integrated PL intensity (black squares) of Te-doped Ga0.74In0.26P samples and their corresponding peak emission energy (blue circles) versus doping concentration at room temperature. Curve fitting (blue solid line) shows an approximate linear regression of emission energy with increasing doping concentration due to BGN effect.

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Fig. 7. (a) XTEM image of Te-doped Ga0.74In0.26P sample at n=5×1018  cm3. (b) Scanning XTEM image at high resolution.

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Cong Wang, Bing Wang, Riko I. Made, Soon-Fatt Yoon, Jurgen Michel. Direct bandgap photoluminescence from n-type indirect GaInP alloys[J]. Photonics Research, 2017, 5(3): 03000239.

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