发光学报, 2017, 38 (1): 63, 网络出版: 2017-02-09   

InGaN/GaN 多量子阱LED载流子泄漏与温度关系研究

Temperature-dependent Carrier Leakage in InGaN/GaN Multiple Quantum Wells Light-emitting Diodes
刘诗涛 1,2,3,*王立 1,2,3伍菲菲 1,2,3杨祺 1,2,3何沅丹 1,2,3张建立 1,2,3全知觉 1,2,3黄海宾 1,2,3
作者单位
1 南昌大学 材料科学与工程学院, 江西 南昌330031
2 南昌大学 国家硅基LED工程技术研究中心, 江西 南昌330047
3 南昌大学 光伏研究院, 江西 南昌330031
引用该论文

刘诗涛, 王立, 伍菲菲, 杨祺, 何沅丹, 张建立, 全知觉, 黄海宾. InGaN/GaN 多量子阱LED载流子泄漏与温度关系研究[J]. 发光学报, 2017, 38(1): 63.

LIU Shi-tao, WANG Li, WU Fei-fei, YANY Qi, HE Yuan-dan, ZHANG Jian-li, QUAN Zhi-jue, HUANG Hai-bin. Temperature-dependent Carrier Leakage in InGaN/GaN Multiple Quantum Wells Light-emitting Diodes[J]. Chinese Journal of Luminescence, 2017, 38(1): 63.

参考文献

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刘诗涛, 王立, 伍菲菲, 杨祺, 何沅丹, 张建立, 全知觉, 黄海宾. InGaN/GaN 多量子阱LED载流子泄漏与温度关系研究[J]. 发光学报, 2017, 38(1): 63. LIU Shi-tao, WANG Li, WU Fei-fei, YANY Qi, HE Yuan-dan, ZHANG Jian-li, QUAN Zhi-jue, HUANG Hai-bin. Temperature-dependent Carrier Leakage in InGaN/GaN Multiple Quantum Wells Light-emitting Diodes[J]. Chinese Journal of Luminescence, 2017, 38(1): 63.

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