液晶与显示, 2009, 24 (4): 557, 网络出版: 2010-05-06
退火温度对ZnO薄膜晶体管电学性能的影响
Effect of Annealing Temperature on Electrical Properties of ZnO-TFT
引用该论文
张新安, 张景文, 张伟风, 侯洵. 退火温度对ZnO薄膜晶体管电学性能的影响[J]. 液晶与显示, 2009, 24(4): 557.
ZHANG Xin-an, ZHANG Jing-wen, ZHANG Wei-feng, HOU Xun. Effect of Annealing Temperature on Electrical Properties of ZnO-TFT[J]. Chinese Journal of Liquid Crystals and Displays, 2009, 24(4): 557.
张新安, 张景文, 张伟风, 侯洵. 退火温度对ZnO薄膜晶体管电学性能的影响[J]. 液晶与显示, 2009, 24(4): 557. ZHANG Xin-an, ZHANG Jing-wen, ZHANG Wei-feng, HOU Xun. Effect of Annealing Temperature on Electrical Properties of ZnO-TFT[J]. Chinese Journal of Liquid Crystals and Displays, 2009, 24(4): 557.