大功率半导体激光器可靠性研究和失效分析
[1] 王立军, 宁永强, 秦莉, 等. 大功率半导体激光器研究进展 ［J］. 发光学报, 2015, 36(1):1-19.
[2] 刘婧, 吕长志, 李志国, 等. 电子元器件加速寿命试验方法的比较 ［J］. 半导体技术, 2006, 31(9):680-683.
LIU J, LV C Z, LI Z G, et al.. Comparison of accelerated life tests of electronic component ［J］. Semicond. Technol., 2006, 31(9):680-683. (in Chinese)
[3] 荣宝辉, 王晓燕, 安振峰, 等. 大功率半导体激光器加速寿命测试方法 ［J］. 半导体技术, 2008, 33(4):360-362.
RONG B H, WANG X Y, AN Z F, et al.. Accelerated life-time test of high-power laser diode ［J］. Semicond. Technol., 2008, 33(4):360-362. (in Chinese)
[4] ISHIKAWA H, FUJIWARA T, FUJIWARA K, et al.. Accelerated aging test of Ga1-xAlxAs DH lasers ［J］. J. Appl. Phys., 1979, 50(4):2518-2522.
[5] ENDO K, MATSUMOTO S, KAWANO H, et al.. Rapid degradation of InGaAsP/lnP double heterostructure lasers due to <110> dark line defect formation ［J］. Appl. Phys. Lett., 1982, 40(11):921-923.
[6] BAO L, WANG J, DEVITO M, et al.. Reliability of high performance 9xx-nm single emitter laser diodes ［J］. SPIE, 2010, 7583:1-10.
[7] 王德宏, 李雅静, 安振峰. 大功率半导体激光器步进加速老化研究 ［J］. 微纳电子技术, 2008, 45(9):508-511.
WANG D H, LI Y J, AN Z F. Reliability of high power semiconductor laser diodes ［J］. Micronanoelectron. Technol., 2008, 45(9):508-511. (in Chinese)
[8] 茆诗松, 王玲玲. 加速寿命试验 ［M］. 北京: 科学出版社, 1997:19-137.
MAO S S, WANG L L. Accelerated Life-time Test ［M］. Beijing: Science Press, 1997:19-137. (in Chinese)
[9] 茆诗松. 加速寿命试验的加速模型 ［J］. 质量与可靠性, 2003(2):15-17.
MAO S S. The accelerated model of accelerated life-time test ［J］. Qual. Reliab., 2003(2):15-17. (in Chinese)
[10] FUSEK M, MICHLEK J. Statistical analysis of analysis of type I multiply left-censored samples from exponential distribution ［J］. J. Stat. Comput. Simul., 2015, 85(11):2148-2163.
[11] 倪羽茜, 井红旗, 孔金霞, 等. 高功率半导体激光器陶瓷封装散热性能研究 ［J］. 发光学报, 2016, 37(5):561-566.
[12] NI Y X, MA X Y, JING H Q, et al.. Finite element analysis of expansion-matched submounts for high-power laser diodes packaging ［J］. J. Semicond., 2016, 37(6):064005.
[13] JING H Q, ZHONG L, NI Y X, et al.. Design and simulation of a novel high-efficiency cooling heat-sink structure using fluid-thermodynamics ［J］. J. Semicond., 2015, 36(10):102006-1-6.
王文知, 井红旗, 祁琼, 王翠鸾, 倪羽茜, 刘素平, 马骁宇. 大功率半导体激光器可靠性研究和失效分析[J]. 发光学报, 2017, 38(2): 165. WANG Wen-zhi, JING Hong-qi, QI Qiong, WANG Cui-luan, NI Yu-xi, LIU Su-ping, MA Xiao-yu. Reliability Test and Failure Analysis of High Power Semicounductor Laser[J]. Chinese Journal of Luminescence, 2017, 38(2): 165.
PDF全文
