利用受激发射损耗(STED)显微术突破远场衍射极限 下载: 641次
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陈文霞, 肖繁荣, 刘力, 王桂英. 利用受激发射损耗(STED)显微术突破远场衍射极限[J]. 激光与光电子学进展, 2005, 42(10): 51. 陈文霞, 肖繁荣, 刘力, 王桂英. Breaking Through the diffraction limit of far-field Optical microscopy by stimulated emission depletion (STED)[J]. Laser & Optoelectronics Progress, 2005, 42(10): 51.